Logicbistsynopsys

由YZorian著作·2015·被引用4次—SynopsyscreatedtheMulti-MemoryBus(MMB)processortotakeadvantageofthepossibilitiesofferedbyFinFETs.TheMMBsharestheBIST/BISRlogicwithall ...,2021年10月12日—LogicBISTisakeyDFTcomponentofthein-systemtestfortestingthenon-memoryportionofthedesign.Unlikescantestwherepatternsare ...,TheSynopsysDuetPackagesofEmbeddedMemoriesandLogicLibrariesinclude...(BIST)andrepairthatenabl...

Design, Test & Repair Methodology for FinFET

由 Y Zorian 著作 · 2015 · 被引用 4 次 — Synopsys created the Multi-Memory Bus (MMB) processor to take advantage of the possibilities offered by FinFETs. The MMB shares the BIST/BISR logic with all ...

Don't Let X Be A Problem For Logic BIST

2021年10月12日 — Logic BIST is a key DFT component of the in-system test for testing the non-memory portion of the design. Unlike scan test where patterns are ...

Logic Library, Memory Compiler, OTP, NVM

The Synopsys Duet Packages of Embedded Memories and Logic Libraries include ... (BIST) and repair that enable designers to achieve the maximum performance ...

Synopsys adds logic BIST tool to test solutions

2002年9月30日 — The tool helps solve the problem of trading fault coverage for test time in dense system-on-chip (SoC) ICs, said David Hsu, director of ...

Synopsys Introduces New Logic BIST Capability to ...

It is an extension of Synopsys' unique 1-pass test synthesis flow, which enables designers to use SoCBIST directly within the physical synthesis environment.

Synopsys TestMAX Test Automotion

... logic BIST, memory self-test and repair and analog fault simulation, ensure the Synopsys TestMAX product family addresses critical test issues and enables ...

TestMAX XLBIST - X-Tolerant Logic Built-in Self

2019年3月8日 — Synopsys TestMAX XLBIST delivers a solution for in-system self-test of digital designs where functional safety is critical, ...

TestMAX XLBIST X-Tolerant Logic Built-in Self

Synopsys TestMAX XLBIST delivers a solution for in-system self-test of digital designs where functional safety is critical, such as in automotive, medical, ...

別讓X成為阻礙Logic BIST 的問題

2021年10月12日 — 影響Logic BIST 測試時間和覆蓋率的主要因素之一，是設計中產生未知(即X) 模擬值的路徑，因為X 會破壞多個測試模型或測試間隔中累積的MISR 簽章符號。這個 ...

新思科技推出TestMAX系列產品以因應層出不窮的測試挑戰

2019年3月20日 — 邏輯BIST通常用於檢查裝置邏輯中的安全故障，然而無法解決諸如投片後時序異常引起的未知電路狀態。TestMAX推出業界首款X容差邏輯(X-tolerant logic) BIST ...